In situ observation of Zn-induced etching during CdSe quantum dot formation using time-resolved ellipsometry

Applied Physics Letters

Volumn 90, Issue 22, 2007, Pages

  Kruse, Carsten ^a   Gartner, Mariuca ^b   Gust, Arne ^a   Hommel, Detlef ^a  

^a UNIVERSITY OF BREMEN   (Germany)

^b INSTITUTE OF PHYSICAL CHEMISTRY   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; DATA ACQUISITION; EPITAXIAL GROWTH; ETCHING; GROWTH RATE; REAL TIME SYSTEMS; ZINC;

MIGRATION ENHANCED EPITAXY; SEGREGATION ENHANCED ETCHING; THICKNESS REDUCTION;

SEMICONDUCTOR QUANTUM DOTS;

EID: 34249883282     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2742930     Document Type: Article

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