Application of power loss calculation to estimate the specific contact resistance of the screen-printed silver ohmic contacts of the large area silicon solar cells

Journal of Materials Science: Materials in Electronics

Volumn 18, Issue 8, 2007, Pages 805-810

  Vinod, P N ^a  

^a NAVAL PHYSICAL AND OCEANOGRAPHIC LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

METAL-TO-SEMICONDUCTOR CONTACT STRUCTURE; THICK-FILM METAL CONTACT; TRANSMISSION LINE MODEL (TLM);

CONTACT RESISTANCE; ITERATIVE METHODS; OHMIC CONTACTS; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE MODELS; SILICON WAFERS; SOLAR CELLS; THICK FILMS;

SEMICONDUCTOR DEVICE STRUCTURES;

EID: 34249865954     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-007-9210-z     Document Type: Article

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