Nature of the Ag-Si interface in screen-printed contacts: A detailed transmission electron microscopy study of cross-sectional structures

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 360-363

  Ballif, C ^a   Huljic D M ^b   Hessler Wyser, A ^c   Willeke, G ^b  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS   (Germany)

^b FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^c EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; DOPING (ADDITIVES); ENERGY DISPERSIVE SPECTROSCOPY; FIRING (OF MATERIALS); INTERFACES (MATERIALS); METALLIZING; SCREEN PRINTING; SILICON WAFERS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

CROSS SECTIONAL STRUCTURES; CRYSTALLITES; SCREEN PRINTED CONTACTS;

SILICON SOLAR CELLS;

EID: 0036953523     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)

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