Specific contact resistance of the porous silicon and silver metal Ohmic contact structure

Semiconductor Science and Technology

Volumn 20, Issue 9, 2005, Pages 966-971

  Vinod, P N ^a  

^a NAVAL PHYSICAL AND OCEANOGRAPHIC LABORATORY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; DOPING (ADDITIVES); ELECTRIC PROPERTIES; INTERFACES (MATERIALS); POROUS SILICON; RELIABILITY;

CONTACT RESISTANCE; CONTACT STRUCTURE; METAL GRIDS; SURFACE DOPING;

OHMIC CONTACTS;

EID: 23944494696     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/20/9/014     Document Type: Article

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