Shortening burn-in test: Application of HVST and weibull statistical analysis

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 3, 2007, Pages 990-999

  Ooi, Melanie Po Leen ^a   Kassim, Zainal Abu ^b   Demidenko, Serge N ^c  

^a MONASH UNIVERSITY MALAYSIA   (Malaysia)

^b FREESCALE SEMICONDUCTOR INC   (United States)

^c MASSEY UNIVERSITY   (New Zealand)

Author keywords

Burn in testing; High voltage stress; Integrated circuits (ICs); Test time reduction; Weibull statistical analysis

Indexed keywords

FAILURE ANALYSIS; MANUFACTURE; STATISTICAL METHODS; STRESSES; WEIBULL DISTRIBUTION;

BURN-IN TESTING; HIGH-VOLTAGE STRESS; WEIBULL STATISTICAL ANALYSIS;

INTEGRATED CIRCUITS;

EID: 34249070785     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.894165     Document Type: Article

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