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Volumn 43, Issue 6, 2007, Pages 2818-2820

Tunneling spectroscopy of magnetic double barrier junctions

Author keywords

Current rectification; Diode effect; Magnetic tunnel junctions (MTJs); Tunneling spectroscopy

Indexed keywords

ELECTRIC CURRENTS; ELECTRODES; SCANNING TUNNELING MICROSCOPY;

EID: 34249058694     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2007.893313     Document Type: Article
Times cited : (2)

References (19)
  • 7
    • 1842759689 scopus 로고    scopus 로고
    • T. Uemura, S. Honma, T. Marukame, and M. Yamamoto, J. Appl. Phys., 43, no. 1A, pp. B L44-L46, 2004.
    • T. Uemura, S. Honma, T. Marukame, and M. Yamamoto, J. Appl. Phys., vol. 43, no. 1A, pp. B L44-L46, 2004.
  • 11
    • 34249107487 scopus 로고    scopus 로고
    • Development and characterization of tunnel junctions with several barriers for integration in a new generation of magnetic memories,
    • Ph.D. dissertation, IPCMS, Strasbourg, France, Sep
    • A. Iovan, "Development and characterization of tunnel junctions with several barriers for integration in a new generation of magnetic memories," Ph.D. dissertation, IPCMS, Strasbourg, France, Sep. 2004.
    • (2004)
    • Iovan, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.