-
1
-
-
0035933562
-
-
Donhauser, Z. J.; Mantooth, B. A.; Kelly, K. F.; Bumm, L. A.; Monnell, J. D.; Stapleton, J. J.; Price, D. W., Jr.; Allara, D. L.; Tour, J. M.; Weiss, P. S. Science 2001, 292, 2303.
-
(2001)
Science
, vol.292
, pp. 2303
-
-
Donhauser, Z.J.1
Mantooth, B.A.2
Kelly, K.F.3
Bumm, L.A.4
Monnell, J.D.5
Stapleton, J.J.6
Price Jr., D.W.7
Allara, D.L.8
Tour, J.M.9
Weiss, P.S.10
-
2
-
-
33746864053
-
-
Keane, Z. K.; Ciszek, J. W.; Tour, J. M.; Natelson, D. Nano Lett. 2006, 6, 1518.
-
(2006)
Nano Lett
, vol.6
, pp. 1518
-
-
Keane, Z.K.1
Ciszek, J.W.2
Tour, J.M.3
Natelson, D.4
-
3
-
-
1842413643
-
-
Reed, M. A.; Zhou, C.; Muller, C. J.; Burgin, T. P.; Tour, J. M. Science 1997, 278, 252.
-
(1997)
Science
, vol.278
, pp. 252
-
-
Reed, M.A.1
Zhou, C.2
Muller, C.J.3
Burgin, T.P.4
Tour, J.M.5
-
4
-
-
13644283486
-
-
Kuekes, P. J.; Stewart, D. R.; Williams, R. S. J. Appl. Phys. 2005, 97, 034301.
-
(2005)
J. Appl. Phys
, vol.97
, pp. 034301
-
-
Kuekes, P.J.1
Stewart, D.R.2
Williams, R.S.3
-
5
-
-
3342934095
-
-
Sakaguchi, H.; Matsumura, H.; Gong, H. Nat. Mater. 2004, 3, 551.
-
(2004)
Nat. Mater
, vol.3
, pp. 551
-
-
Sakaguchi, H.1
Matsumura, H.2
Gong, H.3
-
6
-
-
27744480229
-
-
Sakaguchi, H.; Matsumura, H.; Gong, H.; Abouelwafa, A. M. Science 2005, 310, 1002.
-
(2005)
Science
, vol.310
, pp. 1002
-
-
Sakaguchi, H.1
Matsumura, H.2
Gong, H.3
Abouelwafa, A.M.4
-
7
-
-
0042338679
-
-
He, H. X.; Li, X. L.; Tao, N. J.; Nagahara, L. A.; Amlani, I.; Tsui, R. Phys. Rev. B 2003, 68, 045302.
-
(2003)
Phys. Rev. B
, vol.68
, pp. 045302
-
-
He, H.X.1
Li, X.L.2
Tao, N.J.3
Nagahara, L.A.4
Amlani, I.5
Tsui, R.6
-
8
-
-
0942288732
-
-
Akai-Kasaya, M.; Shimizu, K.; Saito, A.; Aono, M.; Kuwahara, Y. Phys. Rev. Lett. 2003, 91, 255501.
-
(2003)
Phys. Rev. Lett
, vol.91
, pp. 255501
-
-
Akai-Kasaya, M.1
Shimizu, K.2
Saito, A.3
Aono, M.4
Kuwahara, Y.5
-
9
-
-
0001692094
-
-
Brédas, J. L.; Change, R. R.; Silbey, R.; Nicholas, G.; Durand, P. J. Chem. Phys. 1981, 75, 255,
-
(1981)
J. Chem. Phys
, vol.75
, pp. 255
-
-
Brédas, J.L.1
Change, R.R.2
Silbey, R.3
Nicholas, G.4
Durand, P.5
-
12
-
-
0942288750
-
-
Sakamoto, M.; Wasserman, B.; Dresselhaus, M. S.; Wnek, G. E.; Elman, B. S.; Sandman, D. J. J. Appl. Phys. 1986, 60, 2788.
-
(1986)
J. Appl. Phys
, vol.60
, pp. 2788
-
-
Sakamoto, M.1
Wasserman, B.2
Dresselhaus, M.S.3
Wnek, G.E.4
Elman, B.S.5
Sandman, D.J.6
-
14
-
-
24944466013
-
-
Takami, K.; Kuwahara, Y.; Ishii, T.; Akai-Kasaya, M.; Saito, A.; Aono, M. Surf. Sci. 2005, 591, L273.
-
(2005)
Surf. Sci
, vol.591
-
-
Takami, K.1
Kuwahara, Y.2
Ishii, T.3
Akai-Kasaya, M.4
Saito, A.5
Aono, M.6
-
17
-
-
0041568666
-
-
Miura, A.; De Feyter, S.; Abdel-Mottaleb, M. M. S.; Gesauirère, P.; Grim, P. C. M.; Moessner, G.; Sieffert, M.; Klapper, M.; Müllen, K.; De Schryver, F. C. Langmuir 2003, 19, 6474.
-
(2003)
Langmuir
, vol.19
, pp. 6474
-
-
Miura, A.1
De Feyter, S.2
Abdel-Mottaleb, M.M.S.3
Gesauirère, P.4
Grim, P.C.M.5
Moessner, G.6
Sieffert, M.7
Klapper, M.8
Müllen, K.9
De Schryver, F.C.10
-
18
-
-
14044252023
-
-
Sullivan, S. P.; Schnieders, A.; Mbugua, S. K.; Beebe, T. P., Jr. Langmuir 2005, 21, 1322.
-
(2005)
Langmuir
, vol.21
, pp. 1322
-
-
Sullivan, S.P.1
Schnieders, A.2
Mbugua, S.K.3
Beebe Jr., T.P.4
-
19
-
-
31844436293
-
-
Nishio, S.; I-i, D.; Matsuda, H.; Yoshidome, M.; Uji-i, H.; Fukumura, H. Jpn. J. Appl. Phys. 2005, 44, 5417.
-
(2005)
Jpn. J. Appl. Phys
, vol.44
, pp. 5417
-
-
Nishio, S.1
I-i, D.2
Matsuda, H.3
Yoshidome, M.4
Uji-i, H.5
Fukumura, H.6
-
20
-
-
33846336102
-
-
Scott, J. C.; Samuel, J. D. J.; Hou, J. H.; Rettner, C. T.; Miller, R. D. Nano Lett. 2006, 6, 2916.
-
(2006)
Nano Lett
, vol.6
, pp. 2916
-
-
Scott, J.C.1
Samuel, J.D.J.2
Hou, J.H.3
Rettner, C.T.4
Miller, R.D.5
-
21
-
-
0000301864
-
-
Saito, A.; Urai, Y.; Itoh, K. Langmuir 1996, 12, 3938.
-
(1996)
Langmuir
, vol.12
, pp. 3938
-
-
Saito, A.1
Urai, Y.2
Itoh, K.3
-
22
-
-
0018479435
-
-
Tieke, B.; Lieser, G.; Wegner, G. J. Polym. Sci.: Polym. Chem. Ed. 1979, 17, 1631.
-
(1979)
J. Polym. Sci.: Polym. Chem. Ed
, vol.17
, pp. 1631
-
-
Tieke, B.1
Lieser, G.2
Wegner, G.3
-
23
-
-
5544224809
-
-
Lio, A.; Reichart, A.; Nagy, J. O.; Salmeron, M.; Charych, D. H. J. Vac. Sci. Technol., B 1996, 14, 1481.
-
(1996)
J. Vac. Sci. Technol., B
, vol.14
, pp. 1481
-
-
Lio, A.1
Reichart, A.2
Nagy, J.O.3
Salmeron, M.4
Charych, D.H.5
-
24
-
-
0034665787
-
-
Sasaki, D. Y.; Carpick, R. W.; Burns, A. R. J. Colloid Interface Sei. 2000, 229, 490.
-
(2000)
J. Colloid Interface Sei
, vol.229
, pp. 490
-
-
Sasaki, D.Y.1
Carpick, R.W.2
Burns, A.R.3
-
25
-
-
34249076740
-
-
Kibron, Inc
-
Kibron, Inc., http://www.kibron.com.
-
-
-
-
26
-
-
34249092439
-
-
Both purchased from SPI
-
Both purchased from SPI.
-
-
-
-
27
-
-
34249018371
-
-
Model Spectroline 11SC-2, Sigma-Aldrich. The UV lamp was held from 3 to 8 cm above each sample, and the irradiation times varied from 1 to 10 min.
-
Model Spectroline 11SC-2, Sigma-Aldrich. The UV lamp was held from 3 to 8 cm above each sample, and the irradiation times varied from 1 to 10 min.
-
-
-
-
28
-
-
0030107201
-
-
Kelly, K. F.; Sarkar, D.; Prato, S.; Resh, J. S.; Hale, G. D.; Halas, N. J. J. Vac. Sci. Technol., B 1996, 14, 593.
-
(1996)
J. Vac. Sci. Technol., B
, vol.14
, pp. 593
-
-
Kelly, K.F.1
Sarkar, D.2
Prato, S.3
Resh, J.S.4
Hale, G.D.5
Halas, N.J.6
-
29
-
-
34249017729
-
-
RHK
-
RHK, http:www.rhk-tech.com
-
-
-
-
30
-
-
34249094925
-
-
Omicron GmbH, http://www.omicron.de
-
Omicron GmbH
-
-
-
31
-
-
34249084381
-
-
Images were plane and offset-subtracted using WSxM (Nanotec Electronica, http://www.nanotec.es) and XPMPro (RHK, http://www.rhktech.com) to correct for piezo drift and were then converted to grayscale TIFF images using Adobe Photoshop Elements and Adobe Photoshop. No other processing was performed on the images unless stated otherwise.
-
Images were plane and offset-subtracted using WSxM (Nanotec Electronica, http://www.nanotec.es) and XPMPro (RHK, http://www.rhktech.com) to correct for piezo drift and were then converted to grayscale TIFF images using Adobe Photoshop Elements and Adobe Photoshop. No other processing was performed on the images unless stated otherwise.
-
-
-
-
32
-
-
0031573820
-
-
Grim, P. C. M.; De Feyter, S.; Gesquière, A.; Vanoppen, P.; Rücker, M.; Valiyaveettil, S.; Moessner, G.; Müllen, K.; De Schryver, F. C. Angew. Chem., Int. Ed. 1997, 26, 2601.
-
(1997)
Angew. Chem., Int. Ed
, vol.26
, pp. 2601
-
-
Grim, P.C.M.1
De Feyter, S.2
Gesquière, A.3
Vanoppen, P.4
Rücker, M.5
Valiyaveettil, S.6
Moessner, G.7
Müllen, K.8
De Schryver, F.C.9
-
33
-
-
0002985720
-
Molecular Structure and Monolayer Properties
-
Roberts, G. G, Ed, Plenum Press: New York
-
Hann, R. A. Molecular Structure and Monolayer Properties. In Langmuir-Blodgett Films; Roberts, G. G., Ed.; Plenum Press: New York, 1990; p 17.
-
(1990)
Langmuir-Blodgett Films
, pp. 17
-
-
Hann, R.A.1
-
34
-
-
33751063837
-
-
Kuroda, R.; Kishi, E.; Yamano, A.; Hatanaka, K.; Matsuda, H.; Eguchi, K.; Nakagiri, T. J. Vac. Sci. Technol., B 1991, 9, 1180.
-
(1991)
J. Vac. Sci. Technol., B
, vol.9
, pp. 1180
-
-
Kuroda, R.1
Kishi, E.2
Yamano, A.3
Hatanaka, K.4
Matsuda, H.5
Eguchi, K.6
Nakagiri, T.7
-
35
-
-
4344596265
-
-
Han, P.; Mantooth, B. A.; Sykes, E. C. H.; Donhauser, Z. J.; Weiss, P. S. J. Am. Chem. Soc. 2004, 126, 10787.
-
(2004)
J. Am. Chem. Soc
, vol.126
, pp. 10787
-
-
Han, P.1
Mantooth, B.A.2
Sykes, E.C.H.3
Donhauser, Z.J.4
Weiss, P.S.5
-
36
-
-
0003989857
-
Molecular Imaging by STM
-
2nd ed, Güntherodt, H.-J, Wiesendanger, R, Eds, Springer-Verlag Press: Berlin
-
Chiang, S. Molecular Imaging by STM. In Scanning Tunneling Microscopy, 2nd ed.; Güntherodt, H.-J., Wiesendanger, R., Eds.; Springer-Verlag Press: Berlin, 1994; Vol. I, p 181.
-
(1994)
Scanning Tunneling Microscopy
, vol.1
, pp. 181
-
-
Chiang, S.1
-
37
-
-
2842599672
-
Theory of Tip-Sample Interaction
-
Wiesendanger, R, Güntherodt, H.-J, Eds, Spring-Verlag Press: Berlin
-
Ciraci, S. Theory of Tip-Sample Interaction. In Scanning Tunneling Microscopy; Wiesendanger, R., Güntherodt, H.-J., Eds.; Spring-Verlag Press: Berlin, 1996; Vol. III, p 179.
-
(1996)
Scanning Tunneling Microscopy
, vol.3
, pp. 179
-
-
Ciraci, S.1
-
38
-
-
0032481547
-
-
Curran, S.; Carroll, D. L.; Ajayan, P. M.; Redlich, P.; Roth, S.; Ruhle, M.; Blau, W. Adv. Mater. 1998, 3, 311.
-
(1998)
Adv. Mater
, vol.3
, pp. 311
-
-
Curran, S.1
Carroll, D.L.2
Ajayan, P.M.3
Redlich, P.4
Roth, S.5
Ruhle, M.6
Blau, W.7
-
39
-
-
0342407660
-
-
Hua, Z. Y.; Xu, W. J. Vac. Sci. Technol., B 1997, 15, 1353.
-
(1997)
J. Vac. Sci. Technol., B
, vol.15
, pp. 1353
-
-
Hua, Z.Y.1
Xu, W.2
-
40
-
-
34249017062
-
-
Hardware limitations in the Omicron system prevented the use of lower tunneling currents (higher gap resistances) when scanning in UHV
-
Hardware limitations in the Omicron system prevented the use of lower tunneling currents (higher gap resistances) when scanning in UHV.
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-
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