SCOPUS 정보 검색 플랫폼

Volumn 10, Issue 4, 1998, Pages 311-313

Picking needles from nano-haystacks

(7) Curran, Seamus a,d Carroll, David L b,c Ajayan, Pulickel M e Redlich, Philipp b Roth, Siegmar a Rühle, Manfred c Blau, Werner d

a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG (Germany)

b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

c CLEMSON UNIVERSITY (United States)

d TRINITY COLLEGE DUBLIN (Ireland)

e RENSSELAER POLYTECHNIC INSTITUTE (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON; ELECTRONIC STRUCTURE; GRAPHITE; GRAPHITIZATION; MOLECULAR STRUCTURE; MORPHOLOGY; PROBES; SCANNING TUNNELING MICROSCOPY;

DEFECT RELATED STATES; DOPANT EFFECTS; NANOHAYSTACKS; PICKING NEEDLES;

NANOSTRUCTURED MATERIALS;

EID: 0032481547 PISSN: 09359648 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1521-4095(199803)10:4<311::AID-ADMA311>3.0.CO;2-U Document Type: Article

Times cited : (12)

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