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Volumn 17, Issue 3, 2007, Pages 426-431

Study on a PECVD SiC-coated pressure sensor

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL STABILITY; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON CARBIDE; THERMAL EFFECTS; THIN FILMS;

EID: 34248993622     PISSN: 09601317     EISSN: 13616439     Source Type: Journal    
DOI: 10.1088/0960-1317/17/3/002     Document Type: Article
Times cited : (34)

References (13)
  • 1
    • 0033361372 scopus 로고    scopus 로고
    • SiC MEMS: Opportunities and challenges for applications in harsh environments
    • Mehregany M and Zorman C A 1999 SiC MEMS: opportunities and challenges for applications in harsh environments Thin Solid Films 355-356 518-24
    • (1999) Thin Solid Films , vol.355-356 , Issue.1 , pp. 518-524
    • Mehregany, M.1    Zorman, C.A.2
  • 3
    • 0032050502 scopus 로고    scopus 로고
    • Operation of CL(6H)-Sic pressure sensor at 500 °c
    • Okojie R S, Ned A A and Kurtz A D 1998 Operation of CL(6H)-Sic pressure sensor at 500 °C Sensors Actuators A 66 200-3
    • (1998) Sensors Actuators , vol.66 , Issue.1-3 , pp. 200-203
    • Okojie, R.S.1    Ned, A.A.2    Kurtz, A.D.3
  • 4
    • 0037445348 scopus 로고    scopus 로고
    • Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers
    • Atwell A R, Okojie R S, Kornegay K T, Roberson S L and Beliveau A 2003 Simulation, fabrication and testing of bulk micromachined 6H-SiC high-g piezoresistive accelerometers Sensors Actuators A 104 11-8
    • (2003) Sensors Actuators , vol.104 , Issue.1 , pp. 11-18
    • Atwell, A.R.1    Okojie, R.S.2    Kornegay, K.T.3    Roberson, S.L.4    Beliveau, A.5
  • 6
    • 26444523574 scopus 로고    scopus 로고
    • Thermal budget limits of quarter-micrometer foundry CMOS for post-processing MEMS devices
    • Takeuchi H, Wung A, Sun X, Howe R T and King T J 2005 Thermal budget limits of quarter-micrometer foundry CMOS for post-processing MEMS devices IEEE Trans. Electron Devices 52 2081-6
    • (2005) IEEE Trans. Electron Devices , vol.52 , Issue.9 , pp. 2081-2086
    • Takeuchi, H.1    Wung, A.2    Sun, X.3    Howe, R.T.4    King, T.J.5
  • 7
    • 0042284297 scopus 로고    scopus 로고
    • Low-stress PECVD SiC thin films for IC-compatible microstructures
    • Sarro P M, deBoer C R, Korkmaz E and Laros J M W 1998 Low-stress PECVD SiC thin films for IC-compatible microstructures Sensors Actuators A 67 175-80
    • (1998) Sensors Actuators , vol.67 , Issue.1-3 , pp. 175-180
    • Sarro, P.M.1    Deboer, C.R.2    Korkmaz, E.3    Laros, J.M.W.4
  • 8
    • 33645213339 scopus 로고    scopus 로고
    • Fabrication and testing of bulk micromachined silicon carbide piezoresistive pressure sensors for high temperature applications
    • Wu C-H, Zorman C A and Mehregany M 2006 Fabrication and testing of bulk micromachined silicon carbide piezoresistive pressure sensors for high temperature applications IEEE Sensors J. 6 316-24
    • (2006) IEEE Sensors J. , vol.6 , Issue.2 , pp. 316-324
    • Wu, C.-H.1    Zorman, C.A.2    Mehregany, M.3
  • 12
    • 0036319781 scopus 로고    scopus 로고
    • Research on a novel integrated pressure sensor for high temperature
    • Zhang W, Jia J and Liu B 2002 Research on a novel integrated pressure sensor for high temperature Int. J. Nonlinear Sci. Numer. Simul. 3 295-8
    • (2002) Int. J. Nonlinear Sci. Numer. Simul. , vol.3 , pp. 295-298
    • Zhang, W.1    Jia, J.2    Liu, B.3
  • 13
    • 34249007660 scopus 로고    scopus 로고
    • http://www.mems.com.cn/products-02-001.htm


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.