In situ investigation of annealing effect on lamellar stacking structure of polyethylene thin films by synchrotron grazing-incidence small-angle and wide-angle X-ray scattering

Journal of Applied Crystallography

Volumn 40, Issue SUPPL. 1, 2007, Pages

  Sasaki, Sono ^a   Masunaga, Hiroyasu ^a   Tajiri, Hiroo ^a   Inoue, Katsuaki ^a   Okuda, Hiroshi ^b   Noma, Hiromichi ^c   Honda, Kohji ^c   Takahara, Atsushi ^c   Takata, Masaki ^a,d  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b KYOTO UNIVERSITY   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

^d RIKEN HARIMA INSTITUTE   (Japan)

Author keywords

Annealing effect; In situ synchrotron GISAXS; In situ synchrotron GIWAXS; Lamellar stacking structure; Polyethylene thin film

Indexed keywords

EID: 34248370630     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188980700578X     Document Type: Conference Paper

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