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Computational Materials Science

Volumn 40, Issue 1, 2007, Pages 1-5

Study on effects of the feed on AFM-based nano-scratching process using MD simulation

(4) Yan, Yongda a Sun, Tao a Dong, Shen a Liang, Yingchun a

a HARBIN INSTITUTE OF TECHNOLOGY (China)

Author keywords

Atomic force microscopy; Copper; Diamond; Molecular dynamics; Nanopatterning

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DEFORMATION; MICROFABRICATION; MOLECULAR DYNAMICS; POTENTIAL ENERGY;

DIAMOND TIPS; INTERACTIVE FORCES; MOLECULAR DYNAMIC (MD) SIMULATION; NANOPATTERNING;

NANOELECTRONICS;

EID: 34248343758 PISSN: 09270256 EISSN: None Source Type: Journal
DOI: 10.1016/j.commatsci.2006.10.020 Document Type: Article

Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.