Structural phase contrast in polycrystalline organic semiconductor films observed by broadband near-field optical spectroscopy

Nano Letters

Volumn 7, Issue 4, 2007, Pages 998-1002

  Pomraenke, Robert ^a,b   Ropers, Claus ^a   Renard, Julien ^a   Lienau, Christoph ^a,b   Lüer, Larry ^c   Polli, Dario ^c   Cerullo, Giulio ^c  

^a MAX BORN INSTITUT   (Germany)

^b UNIVERSITY OF OLDENBURG   (Germany)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTRA; BAND STRUCTURE; IMAGE ANALYSIS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; POLYCRYSTALLINE MATERIALS;

BROADBAND NEAR-FIELD OPTICAL SPECTROSCOPY; ORGANIC SEMICONDUCTOR FILMS; PHASE-SELECTIVE IMAGING; PHTALOCYANINE FILMS; POLYCRYSTALLINE ORGANIC SEMICONDUCTOR FILMS;

SEMICONDUCTING FILMS;

NANOMATERIAL; ORGANIC COMPOUND;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SEMICONDUCTOR; SPECTROSCOPY; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; ORGANIC CHEMICALS; PARTICLE SIZE; REFRACTOMETRY; SEMICONDUCTORS; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

EID: 34248225274     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070083i     Document Type: Article

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