White-beam synchrotron topographic studies of defects in 6h-sic single crystals

Journal of Physics D: Applied Physics

Volumn 28, Issue 4, 1995, Pages A63-A68

  Dudley, Michael ^a   Wang, Shaoping ^a   Huang, Wei ^a   Carter, Calvin H ^b   Tsvetkov, Valeri F ^b   Fazi, Christian ^c  

^a STONY BROOK UNIVERSITY   (United States)

^b Arkansas Power Electronics International Inc   (United States)

^c U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; SCREWS; SINGLE CRYSTALS; TOPOGRAPHY;

BASAL PLANES; HOLLOW CORES; LINE DEFECTS; SIC SINGLE CRYSTALS; SYNCHROTRON TOPOGRAPHIC; TOPOGRAPHIC IMAGES; VAPOUR TRANSPORT; X-RAY TOPOGRAPHY;

SCREW DISLOCATIONS;

EID: 3743112678     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/28/4A/012     Document Type: Article

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