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Volumn 136, Issue 2, 2007, Pages 597-603
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Surface potential imaging in oxide-nitride-oxide-silicon structure using a field effect transistor cantilever
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Author keywords
AFM; Cantilever; Charge sensing; Field effect transistor (FET)
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FIELD EFFECT TRANSISTORS;
IMAGING SYSTEMS;
SILICA;
SILICON NITRIDE;
THERMAL EFFECTS;
CANTILEVERS;
CHARGE SENSING;
RETENTION TIME;
SURFACE POTENTIAL;
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EID: 34247574176
PISSN: 09244247
EISSN: None
Source Type: Journal
DOI: 10.1016/j.sna.2007.01.005 Document Type: Article |
Times cited : (5)
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References (19)
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