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Volumn 136, Issue 2, 2007, Pages 597-603

Surface potential imaging in oxide-nitride-oxide-silicon structure using a field effect transistor cantilever

Author keywords

AFM; Cantilever; Charge sensing; Field effect transistor (FET)

Indexed keywords

ATOMIC FORCE MICROSCOPY; FIELD EFFECT TRANSISTORS; IMAGING SYSTEMS; SILICA; SILICON NITRIDE; THERMAL EFFECTS;

EID: 34247574176     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sna.2007.01.005     Document Type: Article
Times cited : (5)

References (19)
  • 19
    • 34247585409 scopus 로고    scopus 로고
    • M.S. Suh, Y. Kuk, Korean Patent No. 2003-0041726, 2003.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.