The effect of LaNiO3 buffer layer thickness on the electric properties of Pb(Zr0.53Ti0.47)O3 thin films deposited on titanium foils

Materials Letters

Volumn 61, Issue 14-15, 2007, Pages 3068-3070

  Che, Lingjuan ^a   Cheng, Jinrong ^a   Yu, Shengwen ^a   Meng, Zhongyan ^a  

^a SHANGHAI UNIVERSITY   (China)

Author keywords

Dielectric properties; LNO buffer layer thickness; PZT thin films; Titanium substrate

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; DIELECTRIC PROPERTIES; LANTHANUM COMPOUNDS; METAL FOIL; REMANENCE; THIN FILMS; TITANIUM;

CONDUCTION MODELS; TITANIUM FOILS; TITANIUM SUBSTRATE;

BUFFER LAYERS;

EID: 34247513582     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2006.10.075     Document Type: Article

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