Electrical properties and chemical compatibility of PZT thick film on Ni substrates

Journal of Materials Science

Volumn 38, Issue 18, 2003, Pages 3769-3774

  Benčan, Andreja ^a   Dražič, Goran ^a   Hrovat, Marko ^a   Holc, Janez ^a   Kosec, Marija ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SINTERING; SOLID SOLUTIONS; SOLUBILITY; TRANSMISSION ELECTRON MICROSCOPY;

STANDARD DEVIATION;

THICK FILMS;

EID: 17544399183     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1025984200633     Document Type: Article

References (9)

1. A. LOZINSKI, F. WANG, A. UUSIMÄKI and S. LEPPÄVUORI, Meas. Sci. Technol. 8 (1997) 33.
2. V. FERRARI, D. MARIOLI and A TARONI, ibid. 8 (1997) 42.
3. W. W. WOLNY, in Proc. 2000 12th IEEE Int. Symp. on Applications of Ferroelectrics, edited by S. K. Streiffer, B. J. Gibbons and T. Tsurumi (Honolulu, 2000) p. 257.
4. J. H. YI, R. SEVENO and H. W. GUNDEL, Integr. Ferroelectr. 33 (1999) 199.
5. R. SEVENO, P. LIMOUSIN, D. AVERTY, J.-L. CHARTIER, R. LE BIHAN and H. W. GUNDEL, J. Eur. Ceram. Soc. 20 (2000) 2015.
6. P. TRAN-HUU-HUE, F. LEVASSORT, F. V. MEULEN, J. HOLC, M. KOSEC and M. LETHIECQ, ibid. 21 (2001) 1445.
7. M. KOSEC, J. HOLC, F. LEVASSORT, L. P. TRANHUU-HUE and M. LETHIECQ, in Proc. 34th Int. Symp. on Microelectronics MAPS-2001, October 9-11 (Baltimore, 2001) p. 195.
8. J. I. GOLDSTEIN, D. E. NEWBURY, P. ECHLIN, D. C. JOY, A. D. ROMIG, C. E. LYMAN, C. FIORI and E. LIFSHIN, "Scanning Electron Microscopy and X-ray Microanalysis," 2nd ed. (Plenum Press, New York, 1992) p. 89.
9. G. DRAŽIČ, B. MALIČ and M. KOSEC, Mikrochim. Acta 15 (Suppl.) (1998) 77.