Nano-characterization of a nafion thin film in air and in water by atomic force microscopy

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 1202-1206

  Umemura, Kazuo ^a,b   Wang, Tong ^c   Hara, Masahiko ^d   Kuroda, Reiko ^d,e   Uchida, On ^a   Nagai, Masayuki ^a  

^a TOKYO CITY UNIVERSITY   (Japan)

^b Kamoshita Planning   (Japan)

^c Discovery Research Institute   (Japan)

^d UNIVERSITY OF TOKYO   (Japan)

^e JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247469407     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/237     Document Type: Article

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