Surface observation of solvent-impregnated nafion membrane with atomic force microscopy

Langmuir

Volumn 20, Issue 17, 2004, Pages 6965-6968

  Affoune, Abed M ^a   Yamada, Akifumi ^a   Umeda, Minoru ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METHANOL; MICROSTRUCTURE; NUCLEAR MAGNETIC RESONANCE; SURFACE TOPOGRAPHY; SWELLING; WATER;

FLAT SURFACES; ION CHANNELS; NAFION; SURFACE POTENTIAL MEASUREMENT (SPOM);

SURFACE TREATMENT;

METHANOL; MICROSTRUCTURE; NUCLEAR MAGNETIC RESONANCE; SURFACE TREATMENT; SWELLING; WATER;

EID: 4344637677     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la036329q     Document Type: Article

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