Scaling law investigations in spot sizes dependence in the ns regime

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6101, Issue , 2006, Pages

  Jupe M ^a   Jensen, L ^a   Madebach H ^a   Starke, K ^a   Ristau, D ^a   Lien, Y ^b   Wernham, D ^b  

^a LASER ZENTRUM HANNOVER E V   (Germany)

^b EUROPEAN SPACE AGENCY   (France)

Author keywords

Defect induced damage; ISO12254; LIDT; Ns damage; Power law model; Spot size dependency

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; LASER APPLICATIONS; THRESHOLD ELEMENTS;

DEFECT INDUCED DAMAGE; ISO12254; LIDT; NS- DAMAGE; POWER LAW MODEL; SPOT SIZE DEPENDENCY;

LASER OPTICS;

EID: 33646012669     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.647408     Document Type: Conference Paper

References (9)

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