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Volumn 18, Issue 16, 2007, Pages
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Comparative studies of nanostructural and morphological evolution of CeO2 thin films induced by high-temperature annealing
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Author keywords
[No Author keywords available]
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Indexed keywords
ANNEALING TIME;
ELECTRON BEAM EVAPORATION;
HIGH TEMPERATURE ANNEALING;
MORPHOLOGICAL EVOLUTION;
OXIDIZING ATMOSPHERE;
ANNEALING;
CERIUM COMPOUNDS;
HIGH TEMPERATURE OPERATIONS;
MICROSTRUCTURAL EVOLUTION;
NANOSTRUCTURES;
PULSED LASER DEPOSITION;
SURFACE ROUGHNESS;
THIN FILMS;
CERIUM;
CERIUM OXIDE;
NANOMATERIAL;
UNCLASSIFIED DRUG;
ARTICLE;
COMPARATIVE STUDY;
ELECTRON BEAM;
EVAPORATION;
EVOLUTION;
FILM;
HIGH TEMPERATURE;
MORPHOLOGY;
NANOPORE;
NANOTECHNOLOGY;
OXIDATION;
PRIORITY JOURNAL;
STANDARD;
SURFACE PROPERTY;
TEMPERATURE DEPENDENCE;
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EID: 34247376929
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/18/16/165605 Document Type: Article |
Times cited : (19)
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References (26)
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