메뉴 건너뛰기




Volumn 18, Issue 2, 2007, Pages 375-383

Imaging laser diffractometer for traceable grating pitch calibration

Author keywords

Grating pitch; Laser diffractometer

Indexed keywords

CALIBRATION; CHARGE COUPLED DEVICES; COMPUTATION THEORY; DIFFRACTOMETERS; ERROR ANALYSIS; OPTICAL BEAM SPLITTERS;

EID: 34247278302     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/18/2/S08     Document Type: Conference Paper
Times cited : (24)

References (13)
  • 2
    • 0346281233 scopus 로고    scopus 로고
    • Submicrometre-pitch intercomparison between optical diffraction, scanning electron microscope and atomic force microscope
    • Misumi I et al 2003 Submicrometre-pitch intercomparison between optical diffraction, scanning electron microscope and atomic force microscope Meas. Sci. Technol. 14 2065-74
    • (2003) Meas. Sci. Technol. , vol.14 , Issue.12 , pp. 2065-2074
    • Misumi, I.1    Al, E.2
  • 4
    • 73149090477 scopus 로고    scopus 로고
    • Height and pitch at the nanoscale-How traceable is nanometrology?
    • Koenders L and Meli F 2005 Height and pitch at the nanoscale-How traceable is nanometrology? Nanoscale Calibration Standards and Methods ed G Wilkening and L Koenders (Weinheim: Wiley-VCH) pp 205-19
    • (2005) Nanoscale Calibration Standards and Methods , pp. 205-219
    • Koenders, L.1    Meli, F.2
  • 6
    • 34247179130 scopus 로고    scopus 로고
    • Investigation of gratings with period lengths in the nanometre range
    • Herrmann K, Mirande W, Hasche K and Pohlenz F 2001 Investigation of gratings with period lengths in the nanometre range PTB Report vol F44 pp 78-85
    • (2001) PTB Report , vol.44 , pp. 78-85
    • Herrmann, K.1    Mirande, W.2    Hasche, K.3    Pohlenz, F.4
  • 8
    • 0003177583 scopus 로고    scopus 로고
    • Laser interferometric diffractometry for measurements of diffraction grating spacing
    • Korotkov V I, Pulkin S A, Vitushkin A L and Vitushkin L F 1996 Laser interferometric diffractometry for measurements of diffraction grating spacing Appl. Opt. 35 4782-6
    • (1996) Appl. Opt. , vol.35 , Issue.24 , pp. 4782-4786
    • Korotkov, V.I.1    Pulkin, S.A.2    Vitushkin, A.L.3    Vitushkin, L.F.4
  • 9
    • 34247263977 scopus 로고    scopus 로고
    • Characterisation of optical and UV gratings by means of scanning tunnelling microscopy and optical diffractometry
    • Pisani M and Picotto G B 1998 Characterisation of optical and UV gratings by means of scanning tunnelling microscopy and optical diffractometry PTB Report vol F34 pp 7-11
    • (1998) PTB Report , vol.34 , pp. 7-11
    • Pisani, M.1    Picotto, G.B.2
  • 10
    • 0042634249 scopus 로고    scopus 로고
    • Diffractometric methods for absolute measurement of diffraction-grating spacings
    • Yoon T H, Eom C I, Chung M S and Kong H J 1999 Diffractometric methods for absolute measurement of diffraction-grating spacings Opt. Lett. 24 107-9
    • (1999) Opt. Lett. , vol.24 , pp. 107-109
    • Yoon, T.H.1    Eom, C.I.2    Chung, M.S.3    Kong, H.J.4
  • 11
    • 0005797193 scopus 로고    scopus 로고
    • Calibration of 2 dimensional magnification standards for SPMs and SEMs through optical diffraction: Method, traceability and uncertainties
    • Nunn J 2000 Calibration of 2 dimensional magnification standards for SPMs and SEMs through optical diffraction: method, traceability and uncertainties PTB Report vol F39 pp 17-24
    • (2000) PTB Report , vol.39 , pp. 17-24
    • Nunn, J.1
  • 12
  • 13
    • 17644391032 scopus 로고    scopus 로고
    • Precision laser diffractometry for grating period measurements
    • Song W Y, Jung K Y, O B-H and Park B C 2004 Precision laser diffractometry for grating period measurements J. Kor. Phys. Soc. 45 1510-6
    • (2004) J. Kor. Phys. Soc. , vol.45 , pp. 1510-1516
    • Song, W.Y.1    Jung, K.Y.2    B, -H.O.3    Park, B.C.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.