An optical fiber-taper probe for wafer-scale microphotonic device characterization

Optics Express

Volumn 15, Issue 8, 2007, Pages 4745-4752

  Michael, C P ^a   Borselli, M ^a   Johnson, T J ^a   Chrystal, C ^a   Painter, O ^a  

^a California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROCAVITIES; PHOTONIC DEVICES; PROBES; SILICON; SILICON WAFERS;

COUPLING MEASUREMENTS; MICRODISKS; MICROPHOTONIC DEVICES; PLANAR MICRORING;

OPTICAL FIBERS;

EID: 34247253338     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.004745     Document Type: Article

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32. For doublet modes, the quality factor used in Fig. 4(c) is the average Q between the two standing-wave modes.
33. o = 1532 nm.
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