Thermoelectric properties of n-type nanocrystalline bismuth-telluride-based thin films deposited by flash evaporation

Journal of Applied Physics

Volumn 101, Issue 7, 2007, Pages

  Takashiri, M ^a   Takiishi, M ^b   Tanaka, S ^b   Miyazaki, K ^b   Tsukamoto, H ^b  

^a KOMATSU LTD   (Japan)

^b KYUSHU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY DISPERSIVE X RAY ANALYSIS; FILM GROWTH; GRAIN SIZE AND SHAPE; NANOCRYSTALLINE MATERIALS; SEEBECK COEFFICIENT; THERMAL CONDUCTIVITY; X RAY DIFFRACTION;

BISMUTH TELLURIDE; FLASH EVAPORATION; NANOCRYSTALLINE THIN FILMS; THERMOELECTRIC PROPERTIES;

THIN FILMS;

EID: 34247217486     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2717867     Document Type: Article

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