Growth of ferroelectric bismuth lanthanum nickel titanate thin films by rf magnetron sputtering

Journal of Applied Physics

Volumn 101, Issue 7, 2007, Pages

  Kobune, Masafumi ^a   Fukushima, Koji ^a   Yamaji, Toru ^a   Tada, Hideto ^a   Yazawa, Tetsuo ^a   Fujisawa, Hironori ^a   Shimizu, Masaru ^a   Nishihata, Yasuo ^b   Matsumura, Daiju ^b   Mizuki, Jun'ichiro ^b   Yamaguchi, Hideshi ^c   Kotaka, Yasutoshi ^c   Honda, Koichiro ^c  

^a UNIVERSITY OF HYOGO   (Japan)

^b JAPAN ATOMIC ENERGY AGENCY   (Japan)

^c FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; EPITAXIAL GROWTH; FILM GROWTH; PEROVSKITE; TRANSMISSION ELECTRON MICROSCOPY; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY; X RAY DIFFRACTION;

BISMUTH LANTHANUM NICKEL TITANATE; BOND DISSOCIATION; FOURFOLD ROTATIONAL SYMMETRY; TRANSMISSION ELECTRON MICROSCOPES;

FERROELECTRIC THIN FILMS;

EID: 34247193081     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2713352     Document Type: Article

References (25)

1. J. Rodrigues Contreras, H. Kohlstedt, U. Poppe, R. Waser, and Ch. Buchai, Appl. Phys. Lett. 83, 126 (2003).
2. M. Tsukada, H. Yamasaki, and M. Kondo, Appl. Phys. Lett. 83, 4393 (2003).
3. H. Fujisawa, M. Yoshida, M. Shimizu, and H. Niu, Jpn. J. Appl. Phys., Part 137, 5132 (1998).
4. M. Shimizu, H. Fijisawa, M. Sugiyama, and T. Shiosaki, Jpn. J. Appl. Phys., Part 1 33, 5135 (1994).
5. B. H. Park, B. S. Kang, S. D. Bu, T. W. Noh, J. Lee, and W. Jo, Nature (London) 401, 682 (1999).
6. R. E. Eitel, C. A. Randall, T. R. Shrout, P. W. Rehrig, W. Hackenberger, and S. E. Park, Jpn. J. Appl. Phys., Part 1 40, 5999 (2001).
7. S. M. Choi, C. J. Stringer, T. R. Shrout, and C. A. Randall, J. Appl. Phys. 98, 034108-1 (2005).
8. K. Wittmaack, Surf. Sci. 89, 668 (1979).
9. M. Kobune, Y. Sugie, S. Fujii, H. Tsubakino, and S. Nakashima, J. Ceram. Soc. Jpn. 100, 1060 (1992).
10. M. Kobune, K. Akamatsu, Y. Sugie, S. Fujii, K. Nishimura, and Z. Imamura, J. Electrochem. Soc. Jpn. 1993, 1225 (1993).
11. M. Kobune, S. Fujii, K. Akamatsu, R. Takayama, and A. Tomozawa, J. Ceram. Soc. Jpn. 103, 298 (1995).
12. M. Kobune, S. Fujii, R. Takayama, and A. Tomozawa, Jpn. J. Appl. Phys., Part 1 35, 4980 (1996).
13. M. Kobune, O. Matsuura, T. Matsuzaki, A. Mineshige, S. Fujii, H. Fujisawa, M. Shimizu, and H. Niu, Jpn. J. Appl. Phys., Part 1 39, 5451 (2000).
14. M. Kobune, S. Kojima, Y. Nishioka, and T. Yazawa, J. Jpn. Soc. Powder Powder Metall. 51, 336 (2004).
15. N. Nakanishi, Y. Kotaka, and T. Yamazaki, Ultramicroscopy 106, 233 (2006).
16. K. Wasa et al., Appl. Phys. Lett. 88, 122903-1 (2006).
17. JCPDS Card No. 35-0795.
18. T. Kobayashi, Y. Noguchi, and M. Miyayama, Jpn. J. Appl. Phys., Part 1 43, 6653 (2004).
19. T. Kobayashi, Y. Noguchi, and M. Miyayama, Appl. Phys. Lett. 86, 012907-1 (2005).
20. H. Sawase, H. Kakemoto, S. Wada, and T. Tsurumi, Trans. Mater. Res. Soc. Jpn. 28, 197 (2003).
21. J. W. Coburn and E. Kay, CRC Crit. Rev. Solid State Sci. 4, 561 (1974).
22. JCPDS Card No. 1-071-3756.
23. Y. Nishihata, J. Mizuki, T. Akao, H. Tanaka, M. Uenishi, M. Kimura, T. Okamoto, and M. Hamada, Nature (London) 418, 164 (2002).
24. A. Demourgues, C. Dussarrat, R. Bontchev, B. Darriet, F. Weill, and J. Darriet, Nucl. Instrum. Methods Phys. Res. B 97, 82 (1995).
25. H. Mizoguchi, H. Hosono, H. Kawazoe, M. Yasukawa, S. Fujitsu, and K. Fukumi, Mater. Res. Bull. 34, 373 (1999).