Valence states of bismuth in new mixed-valence oxides: Bi1-xYxO1.5+δ (x = 0.4) by XANES

Materials Research Bulletin

Volumn 34, Issue 3, 1999, Pages 373-379

  Mizoguchi, H ^a   Hosono, H ^a   Kawazoe, H ^a   Yasukawa, M ^b   Fujitsu, S ^c   Fukumi, K ^d  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c SHONAN INSTITUTE OF TECHNOLOGY   (Japan)

^d OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON TRANSITIONS; OXIDATION; OXIDES; POLYCRYSTALLINE MATERIALS; X RAY SPECTROSCOPY;

EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS) SPECTROSCOPY; X RAY ABSORPTION NEAR EDGE STRUCTURE (XANES) SPECTROSCOPY;

BISMUTH COMPOUNDS;

EID: 0032629903     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0025-5408(99)00025-2     Document Type: Article

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