SCOPUS 정보 검색 플랫폼

Volumn 38, Issue 4, 2007, Pages 427-435

Characterization of laser processing of single-crystal natural diamonds using micro-Raman spectroscopic investigations

(3) Sudheer, S K a Mahadevan Pillai, V P a Nayar, V U a

Author keywords

Benching process; Kerf; Laser processing; MEMS (microelectromechanical systems); MOEMS (microoptoelectromechanical systems); Natural diamond

Indexed keywords

DIODES; GRAPHITE; LASER MATERIALS PROCESSING; MEMS; MICROELECTRONICS; MICROMACHINING; NEODYMIUM LASERS; PUMPING (LASER); Q SWITCHING; QUALITY CONTROL; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SURFACE PROPERTIES; YTTRIUM ALUMINUM GARNET;

1064 NM; BEAM PARAMETER; BENCHING PROCESS; KERF; LASER PROCESS; MICRO-RAMAN; MICROELECTROMECHANICAL SYSTEM; MICROOPTOELECTROMECHANICAL SYSTEM; NATURAL DIAMONDS; ND:YAG LASER;

SINGLE CRYSTALS;

EID: 34247168449 PISSN: 03770486 EISSN: 10974555 Source Type: Journal
DOI: 10.1002/jrs.1663 Document Type: Article

Times cited : (22)

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