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Volumn 76, Issue 16, 2004, Pages 4595-4605

Rectilinear ion trap: Concepts, calculations, and analytical performance of a new mass analyzer

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; MASS SPECTROMETRY; OPTIMIZATION; SIGNAL TO NOISE RATIO;

EID: 4043060624     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac049420n     Document Type: Article
Times cited : (246)

References (56)
  • 25
    • 4043154338 scopus 로고    scopus 로고
    • U.S. Patent 5,420,425, 1995
    • Bier, M. E.; Syka, J. E. P. U.S. Patent 5,420,425, 1995.
    • Bier, M.E.1    Syka, J.E.P.2
  • 30
    • 4043170026 scopus 로고    scopus 로고
    • U.S. Patent applied. 2003
    • Ouyang, Z.; Cooks, R. G. U.S. Patent applied. 2003.
    • Ouyang, Z.1    Cooks, R.G.2
  • 35
    • 4043103090 scopus 로고    scopus 로고
    • US Patent 6,403, 955, 2002
    • Senko, M.: US Patent 6,403, 955, 2002
    • Senko, M.1
  • 44
    • 4043170027 scopus 로고    scopus 로고
    • Ph D. Thesis, Justus-Liebig-Universität, Germany
    • Plass, W. R. Ph D. Thesis, Justus-Liebig-Universität, Germany, 2001.
    • (2001)
    • Plass, W.R.1
  • 50
    • 0001700222 scopus 로고
    • March, R. E., Todd, J. F. J., Eds.; CRC Press: Boca Raton, FL
    • Syka, J. E. P. In Practical Aspects of Ion Trap Mass Spectrometry; March, R. E., Todd, J. F. J., Eds.; CRC Press: Boca Raton, FL, 1995; Vol. 1, p 169.
    • (1995) Practical Aspects of Ion Trap Mass Spectrometry , vol.1 , pp. 169
    • Syka, J.E.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.