Study on NDR property of nitro-Benzene SAMs by using UHV-STM

Current Applied Physics

Volumn 7, Issue 5, 2007, Pages 485-489

  Lee, Nam Suk ^a   Shin, Hoon Kyu ^a   Kwon, Young Soo ^a  

^a Dong A University   (South Korea)

Author keywords

Negative differential resistance (NDR); SAMs; Scanning tunneling spectroscopy (STS)

Indexed keywords

ELECTRIC PROPERTIES; ETHANOL; GOLD; LOGIC DEVICES; PHOTOOXIDATION; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY;

BENZENETHIOL; DIFFERENTIAL CONDUCTANCE; SAMS; SCANNING TUNNELING SPECTROSCOPY (STS);

NITROBENZENE;

EID: 34247160370     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2006.10.007     Document Type: Article

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