Bulk electronic properties of V2O3 probed by hard X-ray photoelectron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 156-158, Issue , 2007, Pages 64-67

  Panaccione, G ^a   Sacchi, M ^b   Torelli, P ^c   Offi, F ^d   Cautero, G ^e   Sergo, R ^e   Fondacaro, A ^f   Henriquet, C ^f   Huotari, S ^f   Monaco, G ^f   Paolasini, L ^f  

^a LABORATORIO TASC   (Italy)

^b Universit Pierre et Marie Curie Paris 6   (France)

^c INFM   (Italy)

^d ROMA TRE UNIVERSITY   (Italy)

^e SINCROTRONE TRIESTE   (Italy)

^f EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Electronic properties; Photoemission spectroscopy; Strongly correlated systems

Indexed keywords

ELECTRONIC PROPERTIES; FERMI LEVEL; PHOTOELECTRON SPECTROSCOPY; VALENCE BANDS;

METALLIC PHASE; SATELLITES INTENSITIES; STRONGLY CORRELATED SYSTEMS; VANADIUM SESQUIOXIDE;

VANADIUM COMPOUNDS;

EID: 34247152890     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2006.11.050     Document Type: Article

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