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Volumn 75, Issue 14, 2007, Pages

Multiscale modeling of point defects in Si-Ge(001) quantum wells

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EID: 34147155222     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.75.144103     Document Type: Article
Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.