STM and transport measurements of highly charged ion modified materials

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 258, Issue 1, 2007, Pages 189-193

  Pomeroy, J M ^a   Grube, H ^a   Perrella, A C ^b   Gillaspy, J D ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b U S ARMY RESEARCH LABORATORY   (United States)

Author keywords

Gold; Highly charged ions; Magnetic tunnel junction; Nano feature; Scanning tunnelling microscopy; Transport

Indexed keywords

ELECTRON BEAMS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TRAPS; ION BEAMS; MAGNETIC FIELD EFFECTS; SCANNING TUNNELING MICROSCOPY; SINGLE CRYSTALS; TUNNEL JUNCTIONS;

ELECTRONIC INTERACTIONS; HIGHLY CHARGED IONS (HCI); MULTILAYER SYSTEMS;

HEAVY IONS;

EID: 34147131259     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.193     Document Type: Article

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