Oscillation-induced static deflection in scanning force microscopy

Review of Scientific Instruments

Volumn 78, Issue 1, 2007, Pages

  Heim, Lars Oliver ^a   Johannsmann, Diethelm ^b  

^a MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

^b CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GEOMETRY; IMAGE ANALYSIS; QUARTZ CRYSTAL MICROBALANCES; SUBSTRATES;

OSCILLATION INDUCED STATIC (OIS); QUARTZ RESONATORS; STATIC DEFLECTION;

MOLECULAR VIBRATIONS;

SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; SURFACE PROPERTY;

MICROSCOPY, ATOMIC FORCE; QUARTZ; SURFACE PROPERTIES;

EID: 34047190199     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2424445     Document Type: Article

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