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Materials Transactions

Volumn 48, Issue 2, 2007, Pages 101-104

SAXS and XAFS characterization of precipitates in a high-performance Cu-Ni-Si alloy

(6) Takahashi, Yohei a Sanada, Takashi a Sato, Shigeo a Okajima, Toshihiro b Shinoda, Kozo c Suzuki, Shigeru c

a NISSAN ARC LTD (Japan)

b Kyushu Synchrotron Light Research Center (Japan)

c TOHOKU UNIVERSITY (Japan)

Author keywords

Copper base alloy; Precipitation; Small angle X ray scattering; X ray absorption fine structure

Indexed keywords

CHARACTERIZATION; COLD ROLLING; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; PRECIPITATES; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY; X RAY SCATTERING;

COPPER MATRIX; FACE CENTERED CUBIC; K-EDGE;

COPPER ALLOYS;

EID: 34047164421 PISSN: 13459678 EISSN: None Source Type: Journal
DOI: 10.2320/matertrans.48.101 Document Type: Article

Times cited : (11)

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