The Suzaku high resolution X-ray spectrometer

Publications of the Astronomical Society of Japan

Volumn 59, Issue 1 SPEC. ISS., 2007, Pages

  Kelley, Richard L ^a   Mitsuda, Kazuhisa ^b   Allen, Christine A ^a   Arsenovic, Petar ^a   Audley, Michael D ^c   Bialas, Thomas G ^a   Boyce, Kevin R ^a   Boyle, Robert F ^a   Breon, Susan R ^a   Brown, Gregory V ^d   Cottam, Jean ^a   Dipirro, Michael J ^a   Fujimoto, Ryuichi ^b   Furusho, Tae ^b   Gendreau, Keith C ^a   Gochar, Gene G ^a   Gonzalez, Oscar ^a   Hirabayashi, Masayuki ^e   Holt, Stephen S ^f   Inoue, Hajime ^b   Ishida, Manabu ^g   Ishisaki, Yoshitaka ^g   Jones, Carol S ^a   Keski Kuha, Ritva ^a   Kilbourne, Caroline A ^a   McCammon, Dan ^h   Morita, Umeyo ^g   Moseley, S Harvey ^a   Mott, Brent ^a   Narasaki, Katsuhiro ^e   Ogawara, Yoshiaki ^b   Ohashi, Takaya ^g   Ota, Naomi ⁱ   Panek, John S ^a   Porter, F Scott ^a   Serlemitsos, Aristides ^a   Shirron, Peter J ^a   Sneiderman, Gary A ^a   Szymkowiak, Andrew E ^j   Takei, Yoh ^b   Tveekrem, June L ^a   Volz, Stephen M ^k   Yamamoto, Mikio ^l   Yamasaki, Noriko Y ^b   more..

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b JAPAN AEROSPACE EXPLORATION AGENCY   (Japan)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e SUMITOMO HEAVY INDUSTRIES LTD   (Japan)

^f FRANKLIN W OLIN COLLEGE OF ENGINEERING   (United States)

^g TOKYO METROPOLITAN UNIVERSITY   (Japan)

^h University of Wisconsin Madison   (United States)

ⁱ RIKEN   (Japan)

^j Yale University   (United States)

^k NASA HEADQUARTERS   (United States)

^l UNIVERSITY OF MIYAZAKI   (Japan)

more..

Author keywords

Instrumentation: detectors; X rays: general

Indexed keywords

CALORIMETERS; COOLING SYSTEMS; COSMOLOGY; DEWARS; INSTRUMENT TESTING; ORBITS; SUPERFLUID HELIUM; X RAY DETECTORS; X RAY SPECTROMETERS; X RAY SPECTROSCOPY;

ENERGY RANGES; ENERGY RESOLUTIONS; HIGH RESOLUTION; HIGH RESOLUTION X RAY SPECTROSCOPY; IN-ORBIT; INSTRUMENTATION:DETECTORS; X RAY BANDS; X-RAY GENERAL; X-RAY MICROCALORIMETER; X-RAY SPECTROMETERS;

TEMPERATURE;

EID: 34047141014     PISSN: 00046264     EISSN: None     Source Type: Journal    
DOI: 10.1093/pasj/59.sp1.s77     Document Type: Article

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