Intrinsic l/f noise in doped silicon thermistors for cryogenic calorimeters

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3445, Issue , 1998, Pages 640-644

  Han, S I ^a   Almy, R ^a   Apodaca, E ^a   Bergmann, W ^a   Deiker, S ^a   Lesser, A ^a   McCammon, D ^a   Rawlins, K ^a   Kelley, R L ^a   Moseley, S H ^a   Porter, F S ^a   Stahle, C K ^a   Szymkowiak, A E ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOLOMETERS; CALORIMETERS; CRYOGENIC EQUIPMENT; DETECTORS; ION IMPLANTATION; SEMICONDUCTING SILICON; SPURIOUS SIGNAL NOISE; X RAY APPARATUS;

CRYOGENIC CALORIMETERS;

THERMISTORS;

EID: 0032292063     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)