-
2
-
-
0000443525
-
-
1089-5647 10.1021/jp992853n
-
H. E. Katz and Z. Bao, J. Phys. Chem. B 1089-5647 10.1021/jp992853n 104, 671 (2000).
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 671
-
-
Katz, H.E.1
Bao, Z.2
-
3
-
-
0037599324
-
-
0734-2101 10.1116/1.1559919
-
J. C. Scott, J. Vac. Sci. Technol. A 0734-2101 10.1116/1.1559919 21, 521 (2003).
-
(2003)
J. Vac. Sci. Technol. A
, vol.21
, pp. 521
-
-
Scott, J.C.1
-
4
-
-
19644395321
-
-
0031-9007 10.1103/PhysRevLett.93.116104
-
W. R. Silveira and J. A. Marohn, Phys. Rev. Lett. 0031-9007 10.1103/PhysRevLett.93.116104 93, 116104 (2004).
-
(2004)
Phys. Rev. Lett.
, vol.93
, pp. 116104
-
-
Silveira, W.R.1
Marohn, J.A.2
-
5
-
-
33646766121
-
-
0003-6951 10.1063/1.2201627
-
W. Osikowicz, M. P. de Jong, S. Braun, C. Tengstedt, M. Fahlman, and W. R. Salaneck, Appl. Phys. Lett. 0003-6951 10.1063/1.2201627 88, 193504 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 193504
-
-
Osikowicz, W.1
De Jong, M.P.2
Braun, S.3
Tengstedt, C.4
Fahlman, M.5
Salaneck, W.R.6
-
6
-
-
31944437872
-
-
0003-6951 10.1063/1.2168515
-
C. Tengstedt, W. Osikowicz, W. R. Salaneck, I. D. Parker, C. H. Hsu, and M. Fahlman, Appl. Phys. Lett. 0003-6951 10.1063/1.2168515 88, 053502 (2006).
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 053502
-
-
Tengstedt, C.1
Osikowicz, W.2
Salaneck, W.R.3
Parker, I.D.4
Hsu, C.H.5
Fahlman, M.6
-
7
-
-
0035310066
-
-
0021-8979 10.1063/1.1349859
-
J. Liu, T. F. Guo, Y. Shi, and Y. Yang, J. Appl. Phys. 0021-8979 10.1063/1.1349859 89, 3668 (2001).
-
(2001)
J. Appl. Phys.
, vol.89
, pp. 3668
-
-
Liu, J.1
Guo, T.F.2
Shi, Y.3
Yang, Y.4
-
10
-
-
0031072779
-
-
0379-6779 10.1016/S0379-6779(97)80213-5
-
W. R. Salaneck, M. Logdlund, J. Birgersson, P. Barta, P. Lazarroni, and J. L. Bredas, Synth. Met. 0379-6779 10.1016/S0379-6779(97)80213-5 85, 1219 (1997).
-
(1997)
Synth. Met.
, vol.85
, pp. 1219
-
-
Salaneck, W.R.1
Logdlund, M.2
Birgersson, J.3
Barta, P.4
Lazarroni, P.5
Bredas, J.L.6
-
12
-
-
34249935701
-
-
C. Qiu, US Patent No. 7,030,633 B1 (18 April 2006).
-
(2006)
-
-
Qiu, C.1
-
14
-
-
13944273678
-
-
0163-1829 10.1103/PhysRevB.70.235207
-
Z. Chiguvare and V. Dyakonov, Phys. Rev. B 0163-1829 10.1103/PhysRevB.70. 235207 70, 235207 (2004).
-
(2004)
Phys. Rev. B
, vol.70
, pp. 235207
-
-
Chiguvare, Z.1
Dyakonov, V.2
-
15
-
-
0000146778
-
-
0003-6951 10.1063/1.119692
-
P. S. Davids, Sh. M. Kogan, I. D. Parker, and D. L. Smith, Appl. Phys. Lett. 0003-6951 10.1063/1.119692 71, 930 (1997).
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 930
-
-
Davids, P.S.1
Kogan Sh., M.2
Parker, I.D.3
Smith, D.L.4
-
17
-
-
0041617095
-
-
0003-6951 10.1063/1.116056
-
I. A. Hümmelgen, S. Roman, F. C. Nart, L. O. Ṕres, and E. L. de Sá, Appl. Phys. Lett. 0003-6951 10.1063/1.116056 68, 3194 (1996).
-
(1996)
Appl. Phys. Lett.
, vol.68
, pp. 3194
-
-
Hümmelgen, I.A.1
Roman, S.2
Nart, F.C.3
Ṕres, L.O.4
De Sá, E.L.5
-
18
-
-
0028383097
-
-
0021-8979 10.1063/1.356350
-
I. D. Parker, J. Appl. Phys. 0021-8979 10.1063/1.356350 75, 1656 (1994).
-
(1994)
J. Appl. Phys.
, vol.75
, pp. 1656
-
-
Parker, I.D.1
-
19
-
-
0037421382
-
-
0003-6951 10.1063/1.1532102
-
N. Koch, A. Kahn, J. Ghijsen, J. -J. Pireaux, J. Schwartz, R. L. Johnson, and E. Elschner, Appl. Phys. Lett. 0003-6951 10.1063/1.1532102 82, 70 (2003).
-
(2003)
Appl. Phys. Lett.
, vol.82
, pp. 70
-
-
Koch, N.1
Kahn, A.2
Ghijsen, J.3
Pireaux, J.-J.4
Schwartz, J.5
Johnson, R.L.6
Elschner, E.7
-
20
-
-
0037444925
-
-
0021-8979 10.1063/1.1545162
-
D. Chirvase, Z. Chiguvare, M. Knipper, J. Parisi, V. Dyakonov, and J. C. Hummelen, J. Appl. Phys. 0021-8979 10.1063/1.1545162 93, 3376 (2003).
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 3376
-
-
Chirvase, D.1
Chiguvare, Z.2
Knipper, M.3
Parisi, J.4
Dyakonov, V.5
Hummelen, J.C.6
-
21
-
-
0037103480
-
-
0021-8979 10.1063/1.1494850
-
R. Valaski, L. M. Moreira, L. Micaroni, and I. A. Hümmelgen, J. Appl. Phys. 0021-8979 10.1063/1.1494850 92, 2035 (2002).
-
(2002)
J. Appl. Phys.
, vol.92
, pp. 2035
-
-
Valaski, R.1
Moreira, L.M.2
Micaroni, L.3
Hümmelgen, I.A.4
-
22
-
-
0032178534
-
-
0040-6090 10.1016/S0040-6090(98)00901-8
-
M. Onoda, K. Tada, A. A. Zhakhidov, and K. Yoshino, Thin Solid Films 0040-6090 10.1016/S0040-6090(98)00901-8 331, 76 (1998).
-
(1998)
Thin Solid Films
, vol.331
, pp. 76
-
-
Onoda, M.1
Tada, K.2
Zhakhidov, A.A.3
Yoshino, K.4
-
23
-
-
17444386327
-
-
1566-1199 10.1016/j.orgel.2005.02.003
-
A. Wan, J. Hwang, F. Amy, and A. Kahn, Org. Electron. 1566-1199 10.1016/j.orgel.2005.02.003 6, 47 (2005).
-
(2005)
Org. Electron.
, vol.6
, pp. 47
-
-
Wan, A.1
Hwang, J.2
Amy, F.3
Kahn, A.4
-
24
-
-
0346639239
-
-
0027-8424 10.1073/pnas.0304179101
-
T. W. Lee, J. Zaumseil, Z. Bao, J. W. P. Hsu, and J. A. Rogers, Proc. Natl. Acad. Sci. U.S.A. 0027-8424 10.1073/pnas.0304179101 101, 429 (2004).
-
(2004)
Proc. Natl. Acad. Sci. U.S.A.
, vol.101
, pp. 429
-
-
Lee, T.W.1
Zaumseil, J.2
Bao, Z.3
Hsu, J.W.P.4
Rogers, J.A.5
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