Brownian-bridge-based statistical analysis of the DAC INL caused by current mismatch

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 54, Issue 2, 2007, Pages 146-150

  Radulov, Georgi I ^a   Heydenreich, Markus ^a   van der Hofstad, Remco W ^a   Hegt, Johannes A ^a   van Roermund, Arthur H M ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Brownian Bridge (BB); digital analog converter (DAC); integrated nonlinearity (INL); mismatch; static linearity

Indexed keywords

CONTROL NONLINEARITIES; LINEAR INTEGRATED CIRCUITS; PROBABILITY DENSITY FUNCTION; RANDOM PROCESSES; STATISTICAL METHODS;

BROWNIAN BRIDGE (BB); HIGH-VOLUME CHIP PRODUCTION; INTEGRATED NONLINEARITY (INL); MISMATCH; STATIC LINEARITY;

DIGITAL TO ANALOG CONVERSION;

EID: 33947592642     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2006.886900     Document Type: Article

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