메뉴 건너뛰기




Volumn 1, Issue , 2003, Pages

DNL and INL yield models for a current-steering D/A converter

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; MATHEMATICAL MODELS; REGRESSION ANALYSIS;

EID: 0038489128     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (6)
  • 1
    • 0036292808 scopus 로고    scopus 로고
    • Formulation of INL and DNL yield estimation in current-steering D/A converters
    • Phoenix, USA, III
    • Y. Cong, R. L. Geiger, "Formulation of INL and DNL Yield Estimation in Current-Steering D/A Converters", Proc. of IEEE ISCAS 2002, Phoenix, USA, Vol. III, pp. 149-152.
    • (2002) Proc. of IEEE ISCAS 2002 , vol.3 , pp. 149-152
    • Cong, Y.1    Geiger, R.L.2
  • 2
    • 0038073456 scopus 로고    scopus 로고
    • 2
    • Dec.
    • 2", IEEE JSSC, Vol. 03, No. 12, Dec. 1998, pp. 1948-1958.
    • (1998) IEEE JSSC , vol.3 , Issue.12 , pp. 1948-1958
    • Lin, C.-H.1    Bult, K.2
  • 3
    • 0032316466 scopus 로고    scopus 로고
    • A 12-bit intrinsic accuracy high-speed CMOS DAC
    • Dec.
    • J. Bastos, A. M. Marques, M. S. J. Steyaert, W. Sansen, "A 12-Bit Intrinsic Accuracy High-Speed CMOS DAC", IEEE JSSC, Vol. 33, No. 12, Dec. 1998, pp. 1959-1969.
    • (1998) IEEE JSSC , vol.33 , Issue.12 , pp. 1959-1969
    • Bastos, J.1    Marques, A.M.2    Steyaert, M.S.J.3    Sansen, W.4
  • 4
    • 0022891057 scopus 로고
    • Characterization and modeling of mismatch in MOS transistors for precision analog design
    • Dec.
    • K. R. Lakshmikumar, R. A. Hadaway, M. A. Copeland, "Characterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design", IEEE JSSC, Vol. sc-21, No. 6, Dec. 1986, pp. 1057-1066.
    • (1986) IEEE JSSC , vol.SC-21 , Issue.6 , pp. 1057-1066
    • Lakshmikumar, K.R.1    Hadaway, R.A.2    Copeland, M.A.3
  • 5
    • 0000910482 scopus 로고
    • Reply to 'a comment on "characterization and modeling of mismatch in MOS transistors for precision analog design
    • Feb
    • K. R. Lakshmikumar, M. A. Copeland, R. A. Hadaway, "Reply to 'A comment on "Characterization and Modeling of Mismatch in MOS Transistors for Precision Analog Design"", IEEE JSSC, Vol, 23, No. 1, Feb 1988, pp. 296.
    • (1988) IEEE JSSC , vol.23 , Issue.1 , pp. 296
    • Lakshmikumar, K.R.1    Copeland, M.A.2    Hadaway, R.A.3
  • 6
    • 0033699219 scopus 로고    scopus 로고
    • An accurate statistical yield model for CMOS current-steering D/A converters
    • Geneva, Switzerland, IV
    • A. Van den Bosch, M. Steyaert, W. Sansen, "An Accurate Statistical Yield Model for CMOS Current-Steering D/A Converters", in Proc. of IEEE ISCAS 2000, Geneva, Switzerland, Vol. IV, pp. 105-108.
    • (2000) Proc. of IEEE ISCAS 2000 , vol.4 , pp. 105-108
    • Van den Bosch, A.1    Steyaert, M.2    Sansen, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.