Effective medium-based analysis of nanowire-mediated localized surface plasmon resonance

Applied Optics

Volumn 46, Issue 6, 2007, Pages 872-880

  Kim, Donghyun ^a   Yoon, Soon Joon ^a  

^a Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

NANOWIRES; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE;

FAR FIELD CHARACTERISTICS; LOCALIZED SURFACE PLASMON RESONANCE (LSPR) SENSOR SYSTEM; NANOWIRE LAYER; SENSITIVITY PERFORMANCE;

OPTICAL SENSORS;

EID: 33947505810     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.000872     Document Type: Article

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