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Volumn 301-302, Issue SPEC. ISS., 2007, Pages 410-413

A comparative study of nonpolar a-plane and m-plane AlN grown on 4H-SiC by plasma-assisted molecular-beam epitaxy

Author keywords

A1. Dislocation; A1. Stacking fault; B1. AlN; B1. Nonpolar; B1. Polytype; B1. SiC

Indexed keywords

CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; EPILAYERS; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; SEMICONDUCTOR GROWTH; SILICON CARBIDE;

EID: 33947307312     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.11.287     Document Type: Article
Times cited : (13)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.