The 6H-SiC structure model: Further refinement from SCXRD data from a terrestrial moissanite

American Mineralogist

Volumn 92, Issue 2-3, 2007, Pages 403-407

  Capitani, Gian Carlo ^a   Di Pierro, Simonpietro ^b,c   Tempesta, Gioacchino ^a  

^a UNIVERSITY OF BARI   (Italy)

^b UNIVERSITÉ LYON 1   (France)

^c SAINT GOBAIN RECHERCHE   (France)

Author keywords

6H SiC; Moissanite; SCXRD; Structure

Indexed keywords

MINERALS; SILICON; SILICON CARBIDE; SILICON COMPOUNDS; SINGLE CRYSTALS; STRUCTURE (COMPOSITION); X RAY DETECTORS;

6H-SIC; CRYSTAL STRUCTURE REFINEMENT; EXPERIMENTAL ERRORS; HEXAGONAL CONFIGURATION; INTERLAYER DISTANCE; MOISSANITE; SCXRD; SINGLE CRYSTAL X-RAY DATA;

CRYSTAL STRUCTURE;

CHEMICAL BONDING; CRYSTAL STRUCTURE; MOISSANITE; TWINNING; X-RAY DIFFRACTION;

EID: 33947237454     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2346     Document Type: Conference Paper

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