Diagnosis of repeated failures for discrete event systems with linear-time temporal-logic specifications

IEEE Transactions on Automation Science and Engineering

Volumn 3, Issue 1, 2006, Pages 47-59

  Jiang, Shengbing ^a,b   Kumar, Ratnesh ^a,c  

^a IEEE   (United States)

^b GENERAL MOTORS CORPORATION   (United States)

^c Iowa State University of Science and Technology   (United States)

Author keywords

Discrete event system; Linear time temporal logic (LTL); Repeated failure diagnosis

Indexed keywords

LINEAR-TIME TEMPORAL LOGIC (LTL); REPEATED FAILURE DIAGNOSIS; ROUTING ERRORS;

ALGORITHMS; ERROR ANALYSIS; POLYNOMIALS; PROGRAM DIAGNOSTICS; SPECIFICATIONS; TEMPORAL LOGIC;

DISCRETE EVENT SIMULATION;

EID: 33947183817     PISSN: 15455955     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASE.2005.860613     Document Type: Article

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