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Volumn 45, Issue 5, 2000, Pages 868-882

Template languages for fault monitoring of timed discrete event processes

Author keywords

[No Author keywords available]

Indexed keywords

CONDITION TEMPLATES; ONLINE FAULT MONITORING; SINGLE FINITE STATE PROCESS; TEMPLATE LANGUAGES; TIMED DISCRETE EVENT PROCESSES;

EID: 0034186976     PISSN: 00189286     EISSN: None     Source Type: Journal    
DOI: 10.1109/9.855548     Document Type: Article
Times cited : (108)

References (16)
  • 1
    • 0021455782 scopus 로고
    • Analytical redundancy and the design of robust failure detection systems
    • July
    • E. Y. Chow and A. S. Willsky, "Analytical redundancy and the design of robust failure detection systems," IEEE Trans. Automat. Contr., vol. AC-29, pp. 603-614, July 1984.
    • (1984) IEEE Trans. Automat. Contr. , vol.AC-29 , pp. 603-614
    • Chow, E.Y.1    Willsky, A.S.2
  • 2
    • 0025636702 scopus 로고
    • Fault detection and diagnosis in manufacturing systems: A behavioral model approach
    • Troy, NY, May
    • L. E. Holloway and B. H. Krogh, "Fault detection and diagnosis in manufacturing systems: A behavioral model approach," in Proc. 2nd Int. Conf. Computer Integrated Manufacturing, Troy, NY, May 1990, pp. 252-259.
    • (1990) Proc. 2nd Int. Conf. Computer Integrated Manufacturing , pp. 252-259
    • Holloway, L.E.1    Krogh, B.H.2
  • 3
    • 0022984143 scopus 로고
    • Firmware transitional logic for on-line monitoring and control
    • Athens, Greece, Dec.
    • P. Dersin and J. Florine, "Firmware transitional logic for on-line monitoring and control," in Proc. IEEE Conf. Decision and Control, Athens, Greece, Dec. 1986.
    • (1986) Proc. IEEE Conf. Decision and Control
    • Dersin, P.1    Florine, J.2
  • 4
    • 0024889733 scopus 로고
    • Monitoring manufacturing systems by means of Petri nets with imprecise markings
    • Albany, NY, Sept.
    • R. Valette, J. Cardoso, and D. Dubois, "Monitoring manufacturing systems by means of Petri nets with imprecise markings," in Proc. IEEE Conf. Intelligent Control, Albany, NY, Sept. 1989, pp. 233-238.
    • (1989) Proc. IEEE Conf. Intelligent Control , pp. 233-238
    • Valette, R.1    Cardoso, J.2    Dubois, D.3
  • 5
    • 0028576281 scopus 로고
    • Time templates for discrete event fault monitoring in manufacturing systems
    • Baltimore, MD, June
    • L. E. Holloway and S. Chand, "Time templates for discrete event fault monitoring in manufacturing systems," in Proc. 1994 American Control Conf., Baltimore, MD, June 1994, pp. 701-706.
    • (1994) Proc. 1994 American Control Conf. , pp. 701-706
    • Holloway, L.E.1    Chand, S.2
  • 6
    • 0029766065 scopus 로고    scopus 로고
    • Distributed fault monitoring in manufacturing systems using concurrent discrete-event observations
    • Oct.
    • _, "Distributed fault monitoring in manufacturing systems using concurrent discrete-event observations," Integrated Computer-Aided Eng., vol. 3, no. 4, Oct. 1996.
    • (1996) Integrated Computer-Aided Eng. , vol.3 , Issue.4
  • 8
    • 0030692398 scopus 로고    scopus 로고
    • Modeling and diagnosis of timed discrete event systems - A factory automation example
    • Albuquerque, NM, June
    • Y.-L. Chen and G. Provan, "Modeling and diagnosis of timed discrete event systems - A factory automation example," in Proc. 1997 American Control Conf., Albuquerque, NM, June 1997.
    • (1997) Proc. 1997 American Control Conf.
    • Chen, Y.-L.1    Provan, G.2
  • 9
    • 14644410319 scopus 로고
    • Fault detection and identification in communication networks: A discrete event systems approach
    • University of Illinois, Monticello, IL, Oct.
    • Y. Park and E. K. P. Chong, "Fault detection and identification in communication networks: a discrete event systems approach," in Proc. 33rd Annual Allerton Conf. Communication, Control, and Computing, University of Illinois, Monticello, IL, Oct. 1995, pp. 126-135.
    • (1995) Proc. 33rd Annual Allerton Conf. Communication, Control, and Computing , pp. 126-135
    • Park, Y.1    Chong, E.K.P.2
  • 10
    • 0025461005 scopus 로고
    • Observability of discrete event dynamic systems
    • July
    • C. M. Ozveren and A. S. Willsky, "Observability of discrete event dynamic systems," IEEE Trans. Automat. Contr., vol. 35, pp. 797-806, July 1990.
    • (1990) IEEE Trans. Automat. Contr. , vol.35 , pp. 797-806
    • Ozveren, C.M.1    Willsky, A.S.2
  • 13
    • 33749901007 scopus 로고    scopus 로고
    • Characterizing a confudence space for discrete event timing for fault montoring using discrete sensing and achitation signals
    • to be published
    • S. R. Das and L. E. Holloway, "Characterizing a confudence space for discrete event timing for fault montoring using discrete sensing and achitation signals," IEEE Trans. Syst., Man., Cybern. A, to be published.
    • IEEE Trans. Syst., Man., Cybern. A
    • Das, S.R.1    Holloway, L.E.2
  • 15
    • 85008257747 scopus 로고
    • The theory of timed automata
    • Real-Time: Theory in Practice, J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds. New York: Springer-Verlag
    • R. Alur and D. Dill, "The theory of timed automata," in Real-Time: Theory in Practice, J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds. New York: Springer-Verlag, 1992, vol. 600, Lecture Notes in Computer Science.
    • (1992) Lecture Notes in Computer Science , vol.600
    • Alur, R.1    Dill, D.2
  • 16
    • 0025440454 scopus 로고
    • Concurrency and discrete event control
    • June
    • M. Heymann, "Concurrency and discrete event control," IEEE Contr. Syst. Mag., vol. 10, pp. 103-112, June 1990.
    • (1990) IEEE Contr. Syst. Mag. , vol.10 , pp. 103-112
    • Heymann, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.