메뉴 건너뛰기




Volumn 3, Issue 4, 1996, Pages 244-254

Distributed fault monitoring in manufacturing systems using concurrent discrete-event observations

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATA THEORY; COMPUTER NETWORKS; COMPUTER SIMULATION; FAILURE ANALYSIS; MACHINERY; MONITORING;

EID: 0029766065     PISSN: 10692509     EISSN: None     Source Type: Journal    
DOI: 10.3233/ica-1996-3402     Document Type: Article
Times cited : (24)

References (12)
  • 2
    • 85008257747 scopus 로고
    • The Theory of Timed Automata
    • J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds. Lecture Notes in Computer Science No. 600. Springer-Verlag, New York, 1992
    • Alur, R., and Dill, D. (1992) "The Theory of Timed Automata," in J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds. Real-Time: Theory in Practice, Lecture Notes in Computer Science No. 600. Springer-Verlag, New York, 1992.
    • (1992) Real-Time: Theory in Practice
    • Alur, R.1    Dill, D.2
  • 3
    • 51549096502 scopus 로고
    • Logics and Models of Real Time: A Survey
    • J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds., Lecture Notes in Computer Science No. 600. Springer-Verlag, New York, 1992
    • Alur, R., and Henzinger, T. A. (1992) "Logics and Models of Real Time: A Survey," in J. W. de Bakker, C. Huizing, W. P. de Roever, and G. Rozenberg, Eds., Real-Time: Theory in Practice, Lecture Notes in Computer Science No. 600. Springer-Verlag, New York, 1992.
    • (1992) Real-Time: Theory in Practice
    • Alur, R.1    Henzinger, T.A.2
  • 4
    • 0027805368 scopus 로고
    • Discrete-Event Based Monitoring and Diagnosis of Manufacturing Processes
    • San Francisco
    • Chand, S. (1993a) "Discrete-Event Based Monitoring and Diagnosis of Manufacturing Processes," Proc. 1993 Am. Control Conf., San Francisco, pp. 1508-1512.
    • (1993) Proc. 1993 Am. Control Conf. , pp. 1508-1512
    • Chand, S.1
  • 5
    • 8444242447 scopus 로고
    • A New Control Method for Processes with Discrete-Valued Inputs and Outputs
    • Kawasaki, Japan, January
    • Chand, S. (1993b) "A New Control Method for Processes with Discrete-Valued Inputs and Outputs," Proc. Int. Symp. Autonomous Decentralized Syst., Kawasaki, Japan, January.
    • (1993) Proc. Int. Symp. Autonomous Decentralized Syst.
    • Chand, S.1
  • 6
    • 0022984143 scopus 로고
    • Firmware Transitional Logic for On-Line Monitoring and Control
    • Athens, Greece
    • Dersin, P., and Florine, J. (1986) "Firmware Transitional Logic for On-Line Monitoring and Control," Proc. IEEE Conf. Decision Control, Athens, Greece, pp. 1102-1107.
    • (1986) Proc. IEEE Conf. Decision Control , pp. 1102-1107
    • Dersin, P.1    Florine, J.2
  • 7
    • 0028576281 scopus 로고
    • Time Templates for Discrete Event Fault Monitoring in Manufacturing Systems
    • Baltimore, June
    • Holloway, L., and Chand, S. (1994) "Time Templates for Discrete Event Fault Monitoring in Manufacturing Systems," Proc. 1994 Am. Control Conf., Baltimore, June, pp. 701-706.
    • (1994) Proc. 1994 Am. Control Conf. , pp. 701-706
    • Holloway, L.1    Chand, S.2
  • 9
    • 0025461005 scopus 로고
    • Observability of Discrete Event Dynamic Systems
    • Ozveren, C., and Willsky, A. S. (1990) "Observability of Discrete Event Dynamic Systems," IEEE Trans. Autom Control 35(7): 797-806.
    • (1990) IEEE Trans. Autom Control , vol.35 , Issue.7 , pp. 797-806
    • Ozveren, C.1    Willsky, A.S.2
  • 10
    • 0022895853 scopus 로고
    • Some Considerations on Monitoring in Distributed Real-Time Control of Flexible Manufacturing Systems
    • Milwaukee, WI, September
    • Sahraoui, A., Courvoisier, M., and Valette, R. (1986) "Some Considerations on Monitoring in Distributed Real-Time Control of Flexible Manufacturing Systems," Proc. IECON '86, IEEE Int. Conf. Ind. Electron. Control Instrum., Milwaukee, WI, September, pp. 805-810.
    • (1986) Proc. IECON '86, IEEE Int. Conf. Ind. Electron. Control Instrum. , pp. 805-810
    • Sahraoui, A.1    Courvoisier, M.2    Valette, R.3
  • 11
  • 12
    • 0024889733 scopus 로고
    • Monitoring Manufacturing Systems by Means of Petri Nets with Imprecise Markings
    • Albany, NY
    • Valette, R., Cardoso, J., and Dubois, D. (1989) "Monitoring Manufacturing Systems by Means of Petri Nets with Imprecise Markings," Proc. IEEE Conf. Intell. Control, Albany, NY, pp. 233-238.
    • (1989) Proc. IEEE Conf. Intell. Control , pp. 233-238
    • Valette, R.1    Cardoso, J.2    Dubois, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.