A polynomial algorithm for testing diagnosability of discrete-event systems

IEEE Transactions on Automatic Control

Volumn 46, Issue 8, 2001, Pages 1318-1321

  Jiang, S ^a   Huang, Z ^a   Chandra, V ^a   Kumar, R ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

Complexity; Diagnosability; Discrete event system; Failure diagnosis

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; POLYNOMIALS; SET THEORY;

DISCRETE EVENT SYSTEMS; FAILURE DIAGNOSIS;

LARGE SCALE SYSTEMS;

EID: 0035418515     PISSN: 00189286     EISSN: None     Source Type: Journal    
DOI: 10.1109/9.940942     Document Type: Article

References (6)

1. Modeling and diagnosis of timed discreteevent systems - A factory automation example
2. Time templates for discrete event fault monitoring in manufacturing systems
3. Diagnosability of discrete-event systems and its applications
4. Diagnosability of discrete-event systems
5. Fault diagnosis in timed discrete-event systems
6. Discrete-event systems approach for delay fault analysis in digital circuits