Effect of electric charge accumulation on the surface properties of PS samples irradiated with low energy ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 256, Issue 1, 2007, Pages 396-401

  Yedji, M ^a   Ross, G G ^a  

^a INRS EMT   (Canada)

Author keywords

AFM; Electric charge accumulation; ERD; Ion implantation; Low energy; Polystyrene; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; ELECTRIC INSULATORS; ION BOMBARDMENT; ION IMPLANTATION; SURFACE CHARGE; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC RECOIL DETECTION (ERD); ELECTRIC CHARGE ACCUMULATION; MOLECULAR BONDS; OXYGEN ADSORPTION;

POLYSTYRENES;

EID: 33947114762     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.12.068     Document Type: Article

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