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Volumn 230, Issue 1-4, 2005, Pages 386-390

Effect of electric charge accumulation on low energy ion implantation in insulators

Author keywords

Electric charge accumulation; ERD depth profiles; Hydrogen; Insulators; Ion implantation; Low energy; Polymers

Indexed keywords

ELECTRIC CHARGE; ELECTRIC INSULATORS; ELECTRON EMISSION; HYDROGEN; OPTICAL COLLIMATORS; POLYETHYLENES; SILICON;

EID: 14744287553     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.12.071     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 7
    • 14744300559 scopus 로고    scopus 로고
    • Goodfellow,
  • 8
    • 5844359445 scopus 로고
    • Wafer cooling and Wafer charging in ion implantation
    • J.F. Ziegler North-Holland Amsterdam
    • M.E. Mack Wafer cooling and Wafer charging in ion implantation J.F. Ziegler Handbook of Implantation Technology 1992 North-Holland Amsterdam 599
    • (1992) Handbook of Implantation Technology , pp. 599
    • Mack, M.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.