-
1
-
-
0014767038
-
Selfheating and thermal runaway phenomena in semiconductor devices
-
C. Popescu, "Selfheating and thermal runaway phenomena in semiconductor devices," in Solid-State Electronics, vol. 13, pp. 441-450, 1970.
-
(1970)
Solid-State Electronics
, vol.13
, pp. 441-450
-
-
Popescu, C.1
-
2
-
-
0027697678
-
Current gain collapse in microwave multifinger heterojunction bipolar transistors operated at very high power densities
-
Nov
-
W. Liu et al., "Current gain collapse in microwave multifinger heterojunction bipolar transistors operated at very high power densities," in IEEE Trans. Electron Devices, vol. 40, no. 11, pp. 1917-1927, Nov. 1993.
-
(1993)
IEEE Trans. Electron Devices
, vol.40
, Issue.11
, pp. 1917-1927
-
-
Liu, W.1
-
3
-
-
0000707844
-
Thermal properties of high-power transistors
-
May
-
R. H. Winkler, "Thermal properties of high-power transistors," in IEEE Trans. Electron Devices, vol. 14, no. 5, pp. 260-263, May 1967.
-
(1967)
IEEE Trans. Electron Devices
, vol.14
, Issue.5
, pp. 260-263
-
-
Winkler, R.H.1
-
4
-
-
84948606998
-
Thermal coupling in 2-Finger heterojunction bipolar transistors
-
June
-
W. Liu, "Thermal coupling in 2-Finger heterojunction bipolar transistors," in IEEE Trans. Electron Devices, vol. 42, no. 6, pp. 1033-1038, June 1995.
-
(1995)
IEEE Trans. Electron Devices
, vol.42
, Issue.6
, pp. 1033-1038
-
-
Liu, W.1
-
5
-
-
0030290903
-
Analysis of thermal instability in multi-finger power AlGaAs/GaAs HBT's
-
Nov
-
K. Lu and C. M. Snowden, "Analysis of thermal instability in multi-finger power AlGaAs/GaAs HBT's," in IEEE Trans. Electron Devices, vol. 43, no. 1, pp. 1799-1805, Nov. 1996.
-
(1996)
IEEE Trans. Electron Devices
, vol.43
, Issue.1
, pp. 1799-1805
-
-
Lu, K.1
Snowden, C.M.2
-
6
-
-
0742304012
-
A back-wafer contacted silicon-on-glass integrated bipolar process, Part II - A novel analysis of thermal breakdown
-
Jan
-
N. Nenadovic et al., "A back-wafer contacted silicon-on-glass integrated bipolar process, Part II - A novel analysis of thermal breakdown," in IEEE Trans. Electron Devices, vol. 51, no. 1, pp. 51-62, Jan. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.1
, pp. 51-62
-
-
Nenadovic, N.1
-
7
-
-
33847795728
-
-
PSPICE 9.1 by ORCAD, User's Manual, 1998.
-
PSPICE 9.1 by ORCAD, User's Manual, 1998.
-
-
-
-
8
-
-
0742301753
-
A Back-Wafer Contacted Silicon-On-Glass Integrated Bipolar Process, Part I- The Conflict Electrical Versus Thermal Isolation
-
Jan
-
L. K. Nanver et al., "A Back-Wafer Contacted Silicon-On-Glass Integrated Bipolar Process, Part I- The Conflict Electrical Versus Thermal Isolation," in IEEE Trans. Electron Devices, vol. 51, no. 1, pp. 42-50, Jan. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, Issue.1
, pp. 42-50
-
-
Nanver, L.K.1
-
9
-
-
33847790705
-
-
ATLAS user's manual, Silvaco International, 2002.
-
ATLAS user's manual, Silvaco International, 2002.
-
-
-
-
10
-
-
3142689612
-
A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects
-
V. d'Alessandro et al., "A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects", in Proc. IEEE MIEL, pp. 253-256, 2004.
-
(2004)
Proc. IEEE MIEL
, pp. 253-256
-
-
d'Alessandro, V.1
-
11
-
-
33847778536
-
The language of Technical Computing, The MathWorks, User's guide. Available
-
MATLAB
-
MATLAB, The language of Technical Computing, The MathWorks, User's guide. Available: www.mathworks.com.
-
-
-
-
12
-
-
0034291496
-
Thermal analysis of solid-state device and circuits: An analytical approach
-
Oct
-
N. Rinaldi, "Thermal analysis of solid-state device and circuits: an analytical approach", Solid State Electronics, 44, pp. 1789-1798, Oct. 2000.
-
(2000)
Solid State Electronics
, vol.44
, pp. 1789-1798
-
-
Rinaldi, N.1
-
13
-
-
10644258014
-
Electrothermal limitations on the current density of high-frequency bipolar transistors
-
Dec
-
N. Nenadovic et al., "Electrothermal limitations on the current density of high-frequency bipolar transistors," IEEE Trans. Electron Devices, vol. 51, pp. 2175 - 80, Dec. 2004.
-
(2004)
IEEE Trans. Electron Devices
, vol.51
, pp. 2175-2180
-
-
Nenadovic, N.1
-
14
-
-
27944464969
-
Electrothermal stability of bipolar transistors at medium and high-current operation regimes
-
to be published in Proc
-
N. Nenadovic et al., "Electrothermal stability of bipolar transistors at medium and high-current operation regimes," to be published in Proc. IEEE BCTM 2005.
-
(2005)
IEEE BCTM
-
-
Nenadovic, N.1
-
15
-
-
5444249335
-
Extraction and modelling of selfheating and mutual thermal coupling impedance of bipolar transistors
-
Oct
-
N. Nenadovic et al., "Extraction and modelling of selfheating and mutual thermal coupling impedance of bipolar transistors," in IEEE Journal of Solid-State Circuits, vol. 39, no. 10, pp. 1764-1772, Oct. 2004.
-
(2004)
IEEE Journal of Solid-State Circuits
, vol.39
, Issue.10
, pp. 1764-1772
-
-
Nenadovic, N.1
-
16
-
-
70449600239
-
-
N. Nenadovic et al., Thernal instability in two-finger bipolar transistors, in Proc. IEEE ESSDERC, pp. 203-206, 2003.
-
N. Nenadovic et al., "Thernal instability in two-finger bipolar transistors", in Proc. IEEE ESSDERC, pp. 203-206, 2003.
-
-
-
|