Radiation hardness of high resistivity n- and p-type magnetic Czochralski silicon

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 573, Issue 1-2, 2007, Pages 283-286

  Segneri, G ^a   Borrello, L ^a   Boscardin, M ^b   Bruzzi, M ^c   Creanza, D ^d   Dalla Betta, G F ^b   De Palma, M ^d   Focardi, E ^c   Macchiolo, A ^c   Manna, N ^d   Menichelli, D ^c   Messineo, A ^a   Piemonte, C ^b   Radicci, V ^d   Ronchin, S ^b   Scaringella, M ^c   Sentenac, D ^a   Zorzi, N ^b  

^a UNIVERSITY OF PISA   (Italy)

^b ITC IRST   (Italy)

^c UNIVERSITY OF FLORENCE   (Italy)

^d INFN SEZIONE DI BARI   (Italy)

Author keywords

Defect engineering; Radiation damage; Semiconductor detectors; Silicon particle detectors; SLHC; Super LHC

Indexed keywords

COLLIDING BEAM ACCELERATORS; CRYSTAL GROWTH FROM MELT; LUMINANCE; MAGNETIC MATERIALS; PARTICLE BEAM TRACKING; RADIATION HARDENING; SEMICONDUCTOR DETECTORS;

CERN LARGE HADRON COLLIDERS (SLHC); CZOCHRALSKI SILICON; DEFECT ENGINEERING;

SEMICONDUCTING SILICON;

EID: 33847761830     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.10.262     Document Type: Article

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