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Volumn 2005, Issue , 2005, Pages 522-525

Performance of Carbon Nanotube Field Effect Transistors with doped source and drain extensions and arbitrary geometry

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; COMPUTER SIMULATION; GATE DIELECTRICS; SILICON;

EID: 33847733062     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (17)

References (8)
  • 1
    • 33847697951 scopus 로고    scopus 로고
    • ITRS
    • ITRS 2003, (http://public.itrs.net).
    • (2003)
  • 2
    • 0035718181 scopus 로고    scopus 로고
    • Carbon nanotube field-effect transistors for logic applications
    • R. Martel, HSP Wong, K. Chan, and P. Avouris, "Carbon nanotube field-effect transistors for logic applications", in IEDM Tech. Dig., pp. 159-162, 2001.
    • (2001) IEDM Tech. Dig , pp. 159-162
    • Martel, R.1    Wong, H.S.P.2    Chan, K.3    Avouris, P.4
  • 3
    • 0042991275 scopus 로고    scopus 로고
    • Ballistic carbon nanotube field-effect transistor
    • A. Javey, J. Guo, Q. Wang, M. Lundstrom andH. Dai, " Ballistic carbon nanotube field-effect transistor", Nature, Vol. 424, pp. 654-657, 2003.
    • (2003) Nature , vol.424 , pp. 654-657
    • Javey, A.1    Guo, J.2    Wang, Q.3    Lundstrom andH, M.4    Dai5
  • 4
    • 17944378392 scopus 로고    scopus 로고
    • Self-aligned carbon nanotube transistors with charge transfer doping
    • J. Chen, C. Klinke, A. Afzali, and Ph. Avouris, "Self-aligned carbon nanotube transistors with charge transfer doping", Applied Physics Letters, Vol. 86, pp.123108-123111, 2005.
    • (2005) Applied Physics Letters , vol.86 , pp. 123108-123111
    • Chen, J.1    Klinke, C.2    Afzali, A.3    Avouris, P.4
  • 5
    • 0442311241 scopus 로고    scopus 로고
    • A numerical study of scaling issue for schottky-barrier carbon nanotube transistors
    • J.Guo, S. Datta, and M. Lundstrom, "A numerical study of scaling issue for schottky-barrier carbon nanotube transistors", IEEE Trans. on Electron Devices, Vol. 51, pp.172-177, 2004.
    • (2004) IEEE Trans. on Electron Devices , vol.51 , pp. 172-177
    • Guo, J.1    Datta, S.2    Lundstrom, M.3
  • 7
    • 9544252190 scopus 로고    scopus 로고
    • Comparison of transport properties in carbon nanotube field-effect transistor with Schottky contacts and doped source/drain contacts
    • J. Knoch, S. Mantl, and J. Appenzeller, "Comparison of transport properties in carbon nanotube field-effect transistor with Schottky contacts and doped source/drain contacts", Solid-State Electr., Vol. 49, pp.73-76, 2005.
    • (2005) Solid-State Electr , vol.49 , pp. 73-76
    • Knoch, J.1    Mantl, S.2    Appenzeller, J.3
  • 8
    • 3142671577 scopus 로고    scopus 로고
    • AC performance of nanoelectronics: To-wards a ballistic THz nanotube transistor
    • P.J. Burke, "AC performance of nanoelectronics: to-wards a ballistic THz nanotube transistor",Solid-State Electr., Vol. 48, pp.1981-1986, 2004
    • (2004) Solid-State Electr , vol.48 , pp. 1981-1986
    • Burke, P.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.